Spectroscopy of single metallic nanoparticles using total internal reflection 
microscopy

Sonnichsen, C.; Geier, S.; Hecker, N. E.; von Plessen, G.; Feldmann, J.; Ditlbacher, H.; Lamprecht, B.; Krenn, J. R.; Aussenegg, F. R.; Chan, V. Z. H.; Spatz, Joachim P.; Moller, M.

Local TagsRelease HistoryDetailsSummary

Spectroscopy of single metallic nanoparticles using total internal reflection microscopy

Sonnichsen, C., Geier, S., Hecker, N. E., von Plessen, G., Feldmann, J., Ditlbacher, H., et al. (2000). Spectroscopy of single metallic nanoparticles using total internal reflection microscopy. Applied Physics Letters, 77(19), 2949-2951.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-14CA-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002C-61B3-C

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Sonnichsen, C.¹, Author
Geier, S.¹, Author
Hecker, N. E.¹, Author
von Plessen, G.¹, Author
Feldmann, J.¹, Author
Ditlbacher, H.¹, Author
Lamprecht, B.¹, Author
Krenn, J. R.¹, Author
Aussenegg, F. R.¹, Author
Chan, V. Z. H.¹, Author
Spatz, Joachim P.¹, Author
Moller, M.¹, Author

Affiliations:
1External Organizations, ou_persistent22

Content

show

Details

show

hide

Language(s):

Dates: Date issued: 2000

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: ISI: ISI:000165069500003
ISSN: 0003-6951

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Applied Physics Letters

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: College Park (Maryland) : AIP

Pages: - Volume / Issue: 77 (19) Sequence Number: - Start / End Page: 2949 - 2951 Identifier: -