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  Spectroscopy of single metallic nanoparticles using total internal reflection microscopy

Sonnichsen, C., Geier, S., Hecker, N. E., von Plessen, G., Feldmann, J., Ditlbacher, H., et al. (2000). Spectroscopy of single metallic nanoparticles using total internal reflection microscopy. Applied Physics Letters, 77(19), 2949-2951.

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Sonnichsen, C.1, Author
Geier, S.1, Author
Hecker, N. E.1, Author
von Plessen, G.1, Author
Feldmann, J.1, Author
Ditlbacher, H.1, Author
Lamprecht, B.1, Author
Krenn, J. R.1, Author
Aussenegg, F. R.1, Author
Chan, V. Z. H.1, Author
Spatz, Joachim P.1, Author           
Moller, M.1, Author
Affiliations:
1External Organizations, ou_persistent22              

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 Dates: 2000
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: ISI:000165069500003
ISSN: 0003-6951
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Title: Applied Physics Letters
Source Genre: Journal
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Affiliations:
Publ. Info: College Park (Maryland) : AIP
Pages: - Volume / Issue: 77 (19) Sequence Number: - Start / End Page: 2949 - 2951 Identifier: -