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  Quantitative mapping of fast voltage pulses in tunnel junctions by plasmonic luminescence

Grosse, C., Etzkorn, M., Kuhnke, K., Loth, S., & Kern, K. (2013). Quantitative mapping of fast voltage pulses in tunnel junctions by plasmonic luminescence. Applied Physics Letters, 103(18): 183108. doi:10.1063/1.4827556.

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2013
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 Urheber:
Grosse, Christoph1, Autor
Etzkorn, Markus1, Autor
Kuhnke, Klaus1, Autor
Loth, Sebastian1, 2, 3, Autor           
Kern, Klaus1, 4, Autor
Affiliations:
1Max Planck Institute for Solid State Research, ou_persistent22              
2Dynamics of Nanoelectronic Systems, Research Groups, Max Planck Research Department for Structural Dynamics, Department of Physics, University of Hamburg, External Organizations, ou_2173642              
3Center for Free-Electron Laser Science, Luruper Chaussee 149, 22761 Hamburg, Germany, ou_persistent22              
4École Polytechnique Fédérale de Lausanne, Institute of Condensed Matter Physics, Bâtiment PH, Station 3, 1015 Lausanne, Switzerland, ou_persistent22              

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Schlagwörter: Tunnel junctions; Scanning tunneling microscopy; Electric measurements; Photons; Plasmons
 Zusammenfassung: An optical read-out technique is demonstrated that enables mapping the time-dependent electrostatic potential in the tunnel junction of a scanning tunneling microscope with millivolt and nanosecond accuracy. We measure the time-dependent intensity of plasmonic light emitted from the tunnel junction upon excitation with a nanosecond voltage pulse. The light intensity is found to be a quantitative measure of the voltage between tip and sample. This permits non-invasive mapping of fast voltage transients directly at the tunnel junction. Knowledge of the pulse profile reaching the tunnel junction is applied to optimize the experiment's time response by actively shaping the incident pulses.

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Sprache(n): eng - English
 Datum: 2013-09-192013-10-152013-10-302013-10-28
 Publikationsstatus: Erschienen
 Seiten: 4
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.1063/1.4827556
 Art des Abschluß: -

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Titel: Applied Physics Letters
  Kurztitel : Appl. Phys. Lett.
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: Melville, NY : American Institute of Physics
Seiten: - Band / Heft: 103 (18) Artikelnummer: 183108 Start- / Endseite: - Identifikator: Anderer: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223