Trapping and Reflection Coefficients for exp.3_He in Ni at Oblique Incidence

Chen, C.K.; Eckstein, W.; Scherzer, B.M.U.

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Trapping and Reflection Coefficients for exp.3_He in Ni at Oblique Incidence

Chen, C., Eckstein, W., & Scherzer, B. (1983). Trapping and Reflection Coefficients for exp.3_He in Ni at Oblique Incidence. Applied Physics. A, 31, 37.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A328-3 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A329-1

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Urheber:
Chen, C.K.¹, Autor
Eckstein, W.², Autor
Scherzer, B.M.U.¹, Autor

Affiliations:
1External Organizations, ou_persistent22
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288