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  Ion Scattering and Secondary Ion Mass Spectroscopy

Heiland, W., Park, R., Taglauer, E., & Lagally, M. (1985). Ion Scattering and Secondary Ion Mass Spectroscopy. In Methods of Experimental Physics (pp. 299). Academic Press.

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 Creators:
Heiland, W.1, Author              
Park, R.L.2, Author
Taglauer, E.3, Author              
Lagally, M.2, Author
Affiliations:
1Experimental Plasma Physics 2 (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856292              
2External Organizations, ou_persistent22              
3Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              

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 Dates: 1985
 Publication Status: Published in print
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Title: Methods of Experimental Physics
Source Genre: Book
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Publ. Info: Academic Press
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 299 Identifier: -