Ion Scattering and Secondary Ion Mass Spectroscopy

Heiland, W.; Park, R.L.; Taglauer, E.; Lagally, M.

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Ion Scattering and Secondary Ion Mass Spectroscopy

Heiland, W., Park, R., Taglauer, E., & Lagally, M. (1985). Ion Scattering and Secondary Ion Mass Spectroscopy. In Methods of Experimental Physics (pp. 299). Academic Press.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A39F-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A3A0-2

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Creators:
Heiland, W.¹, Author
Park, R.L.², Author
Taglauer, E.³, Author
Lagally, M.², Author

Affiliations:
1Experimental Plasma Physics 2 (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856292
2External Organizations, ou_persistent22
3Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

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Dates: Date issued: 1985

Publication Status: Issued

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Title: Methods of Experimental Physics

Source Genre: Book

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Publ. Info: Academic Press

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 299 Identifier: -