Depth Profiling of Thin-Films on Ag and Au on Mo Deposited on a Quartz Crystal 
Microbalance

Onsgaard, J.; Taglauer, E.

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Depth Profiling of Thin-Films on Ag and Au on Mo Deposited on a Quartz Crystal Microbalance

Onsgaard, J., & Taglauer, E. (1985). Depth Profiling of Thin-Films on Ag and Au on Mo Deposited on a Quartz Crystal Microbalance. Vacuum, 34, 831.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A3FA-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A3FB-9

Genre: Journal Article

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Creators:
Onsgaard, J.¹, Author
Taglauer, E.², Author

Affiliations:
1External Organizations, ou_persistent22
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

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Dates: Date issued: 1985

Publication Status: Issued

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Title: Vacuum

Source Genre: Journal

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Pages: - Volume / Issue: 34 Sequence Number: - Start / End Page: 831 Identifier: -