Angular Distributions and Differential Sputtering Yields of Binary Compounds as 
a Function of Angle of Incidence

Roth, J.; Bohdansky, J.; Eckstein, W.

Local TagsRelease HistoryDetailsSummary

Angular Distributions and Differential Sputtering Yields of Binary Compounds as a Function of Angle of Incidence

Roth, J., Bohdansky, J., & Eckstein, W. (1983). Angular Distributions and Differential Sputtering Yields of Binary Compounds as a Function of Angle of Incidence. Nuclear Instruments and Methods in Physics Research, 218, 751.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A42A-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A42B-4

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Roth, J.¹, Author
Bohdansky, J.¹, Author
Eckstein, W.¹, Author

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

Content

show

Details

show

hide

Language(s):

Dates: Date issued: 1983

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Nuclear Instruments and Methods in Physics Research

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 218 Sequence Number: - Start / End Page: 751 Identifier: -