Ion Scattering Spectroscopy

Taglauer, E.; Barr, T.L.; Heiland, W.; Davis, L.E.

Lokale TagsFreigabegeschichteDetailsÜbersicht

Ion Scattering Spectroscopy

Taglauer, E., Barr, T., Heiland, W., & Davis, L. (1980). Ion Scattering Spectroscopy. In Applied Surface Analysis (pp. 111). ASTM.

Item is Freigegeben

einblenden: alle ausblenden: alle

Basisdaten

einblenden: ausblenden:

Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A48D-8 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A48E-6

Genre: Buchkapitel

ausblenden:

Urheber:
Taglauer, E.¹, Autor
Barr, T.L.², Autor
Heiland, W.³, Autor
Davis, L.E.², Autor

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288
2External Organizations, ou_persistent22
3Experimental Plasma Physics 2 (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856292