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  Interferometer for the Measurement of the Fresnel Dragging Effect on Microwaves by a Drifting Electron Plasma

Gehre, O., Mayer, H., & Tutter, M. (1969). Interferometer for the Measurement of the Fresnel Dragging Effect on Microwaves by a Drifting Electron Plasma. IEEE Transactions on Instrumentation and Measurement, IM-18, 3, 194-197.

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 Creators:
Gehre, O.1, Author              
Mayer, H.M.2, Author
Tutter, M.1, Author              
Affiliations:
1Experimental Plasma Physics 3 (E3), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856291              
2External Organizations, ou_persistent22              

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 Dates: 1969
 Publication Status: Published in print
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Title: IEEE Transactions on Instrumentation and Measurement
Source Genre: Journal
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Pages: - Volume / Issue: IM-18, 3 Sequence Number: - Start / End Page: 194 - 197 Identifier: -