Interferometer for the Measurement of the Fresnel Dragging Effect on Microwaves 
by a Drifting Electron Plasma

Gehre, O.; Mayer, H.M.; Tutter, M.

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Interferometer for the Measurement of the Fresnel Dragging Effect on Microwaves by a Drifting Electron Plasma

Gehre, O., Mayer, H., & Tutter, M. (1969). Interferometer for the Measurement of the Fresnel Dragging Effect on Microwaves by a Drifting Electron Plasma. IEEE Transactions on Instrumentation and Measurement, IM-18, 3, 194-197.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-AD98-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-AD99-6

Genre: Journal Article

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Creators:
Gehre, O.¹, Author
Mayer, H.M.², Author
Tutter, M.¹, Author

Affiliations:
1Experimental Plasma Physics 3 (E3), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856291
2External Organizations, ou_persistent22

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Dates: Date issued: 1969

Publication Status: Issued

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Title: IEEE Transactions on Instrumentation and Measurement

Source Genre: Journal

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Pages: - Volume / Issue: IM-18, 3 Sequence Number: - Start / End Page: 194 - 197 Identifier: -