Ion Scattering and Surface Analysis

Heiland, W.

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Ion Scattering and Surface Analysis

Heiland, W. (1975). Ion Scattering and Surface Analysis. Moderne Methoden der Oberflaechenphysik, Bd. 78, 181-195.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-AF05-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-AF06-D

Genre: Conference Paper

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Creators:
Heiland, W.^{1, 2}, Author

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288
2Experimental Plasma Physics 2 (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856292

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Dates: Date issued: 1975

Publication Status: Issued

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Title: Moderne Methoden der Oberflaechenphysik

Place of Event: Frankfurt (DE)

Start-/End Date: 1972-12-04 - 1972-12-05

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Title: Moderne Methoden der Oberflaechenphysik

Source Genre: Journal

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Pages: - Volume / Issue: Bd. 78 Sequence Number: - Start / End Page: 181 - 195 Identifier: -