English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Analysis of Surface Layers by Light Ion Back-Scattering and Sputtering Combined with AUGER Electron Spectroscopy

Behrisch, R., Scherzer, B., & Staib, P. (1973). Analysis of Surface Layers by Light Ion Back-Scattering and Sputtering Combined with AUGER Electron Spectroscopy. Thin Solid Films, 19, 57-67.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Behrisch, R.1, Author              
Scherzer, B.M.U.2, Author
Staib, P.2, Author
Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              
2External Organizations, ou_persistent22              

Content

show

Details

show
hide
Language(s):
 Dates: 1973
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Thin Solid Films
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 19 Sequence Number: - Start / End Page: 57 - 67 Identifier: -