An Electronic Aperture for In-Depth Analysis of Solids with an Ion Microprobe

Hofer, W.O.; Liebl, H.; Roos, G.; Staudenmaier, G.

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An Electronic Aperture for In-Depth Analysis of Solids with an Ion Microprobe

Hofer, W., Liebl, H., Roos, G., & Staudenmaier, G. (1976). An Electronic Aperture for In-Depth Analysis of Solids with an Ion Microprobe. International Journal of Mass Spectrometry and Ion Physics, 19, 327-334.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-B9A3-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-B9A4-D

Genre: Journal Article

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Creators:
Hofer, W.O.¹, Author
Liebl, H.², Author
Roos, G.³, Author
Staudenmaier, G.², Author

Affiliations:
1External Organizations, ou_persistent22
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288
3Central Technical Service (ZTE), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856299

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Dates: Date issued: 1976

Publication Status: Issued

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Title: International Journal of Mass Spectrometry and Ion Physics

Source Genre: Journal

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Pages: - Volume / Issue: 19 Sequence Number: - Start / End Page: 327 - 334 Identifier: -