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  Achievable Depth Resolution in Profiling Light Atoms by Nuclear Reactions

Eckstein, W., Meyer, O., Behrisch, R., & Roth, J. (1976). Achievable Depth Resolution in Profiling Light Atoms by Nuclear Reactions. In Ion Beam Surface Layer Analysis (pp. 821-830).

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 Creators:
Eckstein, W.1, Author           
Meyer, O.2, Author
Behrisch, R.1, Author           
Roth, J.1, Author           
Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              
2External Organizations, ou_persistent22              

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 Dates: 1976
 Publication Status: Published in print
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Title: Ion Beam Surface Layer Analysis
Source Genre: Book
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Pages: - Volume / Issue: Vol. 2 Sequence Number: - Start / End Page: 821 - 830 Identifier: -