Achievable Depth Resolution in Profiling Light Atoms by Nuclear Reactions

Eckstein, W.; Meyer, O.; Behrisch, R.; Roth, J.

Local TagsRelease HistoryDetailsSummary

Achievable Depth Resolution in Profiling Light Atoms by Nuclear Reactions

Eckstein, W., Meyer, O., Behrisch, R., & Roth, J. (1976). Achievable Depth Resolution in Profiling Light Atoms by Nuclear Reactions. In Ion Beam Surface Layer Analysis (pp. 821-830).

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-B9BB-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-B9BC-A

Genre: Book Chapter

Files

show Files

Locators

show

Creators

show

hide

Creators:
Eckstein, W.¹, Author
Meyer, O.², Author
Behrisch, R.¹, Author
Roth, J.¹, Author

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288
2External Organizations, ou_persistent22

Content

show

Details

show

hide

Language(s):

Dates: Published in Print: 1976

Publication Status: Published in print

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Ion Beam Surface Layer Analysis

Source Genre: Book

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: Vol. 2 Sequence Number: - Start / End Page: 821 - 830 Identifier: -