Dependence of Blister-Deckeldichte and of Depth Profiles of Implanted He Ions 
in Nb on Angle of Incidence

Risch, M.R.; Roth, J.; Scherzer, B.M.U.

Local TagsRelease HistoryDetailsSummary

Dependence of Blister-Deckeldichte and of Depth Profiles of Implanted He Ions in Nb on Angle of Incidence

Risch, M., Roth, J., & Scherzer, B. (1979). Dependence of Blister-Deckeldichte and of Depth Profiles of Implanted He Ions in Nb on Angle of Incidence. Journal of Nuclear Materials, 82, 220-226.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-BA67-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-BA68-D

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Risch, M.R.¹, Author
Roth, J.², Author
Scherzer, B.M.U.¹, Author

Affiliations:
1External Organizations, ou_persistent22
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

Content

show

Details

show

hide

Language(s):

Dates: Date issued: 1979

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Journal of Nuclear Materials

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 82 Sequence Number: - Start / End Page: 220 - 226 Identifier: -