New Trends in Instrumentation

Liebl, H.

Local TagsRelease HistoryDetailsSummary

New Trends in Instrumentation

Liebl, H. (1979). New Trends in Instrumentation. In Secondary Ion Mass Spectrometry (pp. 205-210).

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-BAC9-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-BACA-4

Genre: Conference Paper

Files

show Files

Locators

show

Creators

show

hide

Creators:
Liebl, H.¹, Author

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

Content

show

Details

show

hide

Language(s):

Dates: Date issued: 1979

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

hide

Title: Secondary Ion Mass Spectrometry

Place of Event: Osaka (JP)

Start-/End Date: 1978-10-22 - 1978-10-28

Legal Case

show

Project information

show

Source 1

show

hide

Title: Secondary Ion Mass Spectrometry

Source Genre: Proceedings

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 205 - 210 Identifier: -