New Trends in Instrumentation

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New Trends in Instrumentation

Liebl, H. (1979). New Trends in Instrumentation. In Secondary Ion Mass Spectrometry (pp. 205-210).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-BAC9-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-BACA-4

Genre: Conference Paper

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Creators:
Liebl, H.¹, Author

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

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Dates: Date issued: 1979

Publication Status: Issued

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Title: Secondary Ion Mass Spectrometry

Place of Event: Osaka (JP)

Start-/End Date: 1978-10-22 - 1978-10-28

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Title: Secondary Ion Mass Spectrometry

Source Genre: Proceedings

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 205 - 210 Identifier: -