Investigation of Dislocations by Backscattering Spectrometry and Transmission 
Electron Microscopy

Tseng, W.F.; Gyulai, J.; Koji, T.; Lau, S.S.; Roth, J.; Mayer, J.W.

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Investigation of Dislocations by Backscattering Spectrometry and Transmission Electron Microscopy

Tseng, W., Gyulai, J., Koji, T., Lau, S., Roth, J., & Mayer, J. (1977). Investigation of Dislocations by Backscattering Spectrometry and Transmission Electron Microscopy. Nuclear Instruments and Methods, 149, 615-617.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-BBA1-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-BBA2-0

Genre: Journal Article

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Creators:
Tseng, W.F.¹, Author
Gyulai, J.¹, Author
Koji, T.¹, Author
Lau, S.S.¹, Author
Roth, J.², Author
Mayer, J.W.¹, Author

Affiliations:
1External Organizations, ou_persistent22
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

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Dates: Date issued: 1977

Publication Status: Issued

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Title: Nuclear Instruments and Methods

Source Genre: Journal

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Pages: - Volume / Issue: 149 Sequence Number: - Start / End Page: 615 - 617 Identifier: -