Low-Energy Sputtering Yields of Nickel as a Function of Ion Mass - A 
Reinvestigation

Bay, H.L.; Bohdansky, J.; Hechtl, E.

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Low-Energy Sputtering Yields of Nickel as a Function of Ion Mass - A Reinvestigation

Bay, H., Bohdansky, J., & Hechtl, E. (1979). Low-Energy Sputtering Yields of Nickel as a Function of Ion Mass - A Reinvestigation. Radiation Effects, 41, 77-79.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-BD57-A Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-BD58-8

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Urheber:
Bay, H.L.¹, Autor
Bohdansky, J.², Autor
Hechtl, E.¹, Autor

Affiliations:
1External Organizations, ou_persistent22
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288