Direct Comparison of Low-Energy Ion Backscattering with Auger Electron 
Spectroscopy in the Analysis of S Adsorbed on Ni

Taglauer, E.; Heiland, W.

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Direct Comparison of Low-Energy Ion Backscattering with Auger Electron Spectroscopy in the Analysis of S Adsorbed on Ni

Taglauer, E., & Heiland, W. (1974). Direct Comparison of Low-Energy Ion Backscattering with Auger Electron Spectroscopy in the Analysis of S Adsorbed on Ni. Applied Physics Letters, 24, 437-439.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-C874-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-C875-F

Genre: Journal Article

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Taglauer, E.¹, Author
Heiland, W.^{1, 2}, Author

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1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288
2Experimental Plasma Physics 2 (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856292

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Dates: Date issued: 1974

Publication Status: Issued

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Title: Applied Physics Letters

Source Genre: Journal

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Pages: - Volume / Issue: 24 Sequence Number: - Start / End Page: 437 - 439 Identifier: -