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  Abstract: Surface Analytical Studies Using Ion Scattering Spectrometry, Auger Electron Spectroscopy and Secondary Ion Mass Spectrometry

Heiland, W., & Taglauer, E. (1975). Abstract: Surface Analytical Studies Using Ion Scattering Spectrometry, Auger Electron Spectroscopy and Secondary Ion Mass Spectrometry. The Journal of Vacuum Science and Technology, 12, 352.

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 Creators:
Heiland, W.1, 2, Author           
Taglauer, E.1, Author           
Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288              
2Experimental Plasma Physics 2 (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856292              

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 Dates: 1975
 Publication Status: Issued
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Title: The Journal of Vacuum Science and Technology
Source Genre: Journal
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Pages: - Volume / Issue: 12 Sequence Number: - Start / End Page: 352 Identifier: -