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  Application of 2-D Plasma Edge Modelling to Next Step Devices in the High Recycling Regime

Pacher, H., D'Haeseleer, W., & Pacher, G. (1993). Application of 2-D Plasma Edge Modelling to Next Step Devices in the High Recycling Regime. In IAEA Technical Committee Meeting on Advances in Simulation and Modelling of Thermonuclear Plasmas (pp. 457-466).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-CC69-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-CC6A-7
Genre: Conference Paper

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 Creators:
Pacher, H.D.1, Author
D'Haeseleer, W.D.1, Author
Pacher, G.W.1, Author
International Atomic Energy Agency, Vienna(AT), Editor              
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1External Organizations, ou_persistent22              

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 Dates: 1993
 Publication Status: Issued
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Title: IAEA Technical Committee Meeting on Advances in Simulation and Modelling of Thermonuclear Plasmas
Place of Event: Montreal (CA)
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Title: IAEA Technical Committee Meeting on Advances in Simulation and Modelling of Thermonuclear Plasmas
Source Genre: Proceedings
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Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 457 - 466 Identifier: -