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  Ultrafast Broadband Frequency Modulation of a Continous Wave Reflectometry System to Measure Density Profiles on ASDEX Upgrade

Silva, A., Manso, M., Cupido, L., Albrecht, M., Kallenbach, A., Kurzan, B., et al. (1996). Ultrafast Broadband Frequency Modulation of a Continous Wave Reflectometry System to Measure Density Profiles on ASDEX Upgrade. Review of Scientific Instruments, 67, 12, 4138-4145.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-CEF1-5 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-CEF2-3
Genre: Journal Article

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 Creators:
Silva, A.1, Author
Manso, M.E.1, Author
Cupido, L.1, Author
Albrecht, M.2, Author              
Kallenbach, A.3, Author              
Kurzan, B.2, Author              
Suttrop, W.2, Author              
ASDEX-Upgrade-Team1, Author
et al.1, Author
Affiliations:
1External Organizations, ou_persistent22              
2Experimental Plasma Physics 1 (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856295              
3Experimental Plasma Physics 4 (E4), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856293              

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 Dates: 1996
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: -
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Title: Review of Scientific Instruments
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 67, 12 Sequence Number: - Start / End Page: 4138 - 4145 Identifier: -