Microwave Reflectometry Diagnostics for Density Profile and Fluctuation 
Measurements on ASDEX Upgrade

Silva, A.; Cupido, L.; Manso, M.; Kurzan, B.; Suttrop, W.; et al.,

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Microwave Reflectometry Diagnostics for Density Profile and Fluctuation Measurements on ASDEX Upgrade

Silva, A., Cupido, L., Manso, M., Kurzan, B., Suttrop, W., & et al. (1999). Microwave Reflectometry Diagnostics for Density Profile and Fluctuation Measurements on ASDEX Upgrade. 12th Topical Conference on High-Temperature Plasma Diagnostics, 70, 1072-1075.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-D26D-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-D26E-3

Genre: Conference Paper

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Creators:
Silva, A.¹, Author
Cupido, L.¹, Author
Manso, M.¹, Author
Kurzan, B.², Author
Suttrop, W.³, Author
et al.¹, Author

Affiliations:
1External Organizations, ou_persistent22
2Experimental Plasma Physics 2 (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856292
3Experimental Plasma Physics 1 (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856295

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Dates: Date issued: 1999

Publication Status: Issued

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Title: 12th Topical Conference on High-Temperature Plasma Diagnostics

Place of Event: Princeton, NJ(US)

Start-/End Date: 1998-06-07 - 1998-06-11

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Title: 12th Topical Conference on High-Temperature Plasma Diagnostics

Source Genre: Journal

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Pages: - Volume / Issue: 70 Sequence Number: - Start / End Page: 1072 - 1075 Identifier: -