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  Microwave Reflectometry Diagnostics for Density Profile and Fluctuation Measurements on ASDEX Upgrade

Silva, A., Cupido, L., Manso, M., Kurzan, B., Suttrop, W., & et al. (1999). Microwave Reflectometry Diagnostics for Density Profile and Fluctuation Measurements on ASDEX Upgrade. 12th Topical Conference on High-Temperature Plasma Diagnostics, 70, 1072-1075.

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 Creators:
Silva, A.1, Author
Cupido, L.1, Author
Manso, M.1, Author
Kurzan, B.2, Author           
Suttrop, W.3, Author           
et al.1, Author
Affiliations:
1External Organizations, ou_persistent22              
2Experimental Plasma Physics 2 (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856292              
3Experimental Plasma Physics 1 (E1), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856295              

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 Dates: 1999
 Publication Status: Issued
 Pages: -
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 Rev. Type: -
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Title: 12th Topical Conference on High-Temperature Plasma Diagnostics
Place of Event: Princeton, NJ(US)
Start-/End Date: 1998-06-07 - 1998-06-11

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Title: 12th Topical Conference on High-Temperature Plasma Diagnostics
Source Genre: Journal
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Pages: - Volume / Issue: 70 Sequence Number: - Start / End Page: 1072 - 1075 Identifier: -