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  Power spectrum analysis with least-squares fitting: Amplitude bias and its elimination, with application to optical tweezers and atomic force microscope cantilevers

Nørrelykke, S. F., & Flyvbjerg, H. (2010). Power spectrum analysis with least-squares fitting: Amplitude bias and its elimination, with application to optical tweezers and atomic force microscope cantilevers. Review of Scientific Instruments, 81(7): 075103.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-8ED0-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-8ED1-B
Genre: Journal Article

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 Creators:
Nørrelykke, S. F.1, Author           
Flyvbjerg, H., Author
Affiliations:
1Max Planck Institute for the Physics of Complex Systems, Max Planck Society, ou_2117288              

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Free keywords: -
 MPIPKS: Stochastic processes
 Abstract: -

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Language(s): eng - English
 Dates: 2010-07
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 545751
ISI: 000281033400057
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Title: Review of Scientific Instruments
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 81 (7) Sequence Number: 075103 Start / End Page: - Identifier: ISSN: 0034-6748