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  Nondestructive high-resolution soft-boundary profiling based on forward shadow diffraction

Moon, S., Yang, J. H., Lee, S. B., Shim, J. B., Kim, S. W., Lee, J. H., et al. (2008). Nondestructive high-resolution soft-boundary profiling based on forward shadow diffraction. Optics Express, 16(15), 11007-11020.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-9494-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-9495-A
Genre: Journal Article

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 Creators:
Moon, S., Author
Yang, J. H., Author
Lee, S. B., Author
Shim, J. B.1, Author           
Kim, S. W.1, Author           
Lee, J. H., Author
An, K., Author
Affiliations:
1Max Planck Institute for the Physics of Complex Systems, Max Planck Society, ou_2117288              

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 MPIPKS: Semiclassics and chaos in quantum systems
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Language(s): eng - English
 Dates: 2008-07-21
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 405323
ISI: 000258069100016
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Title: Optics Express
  Alternative Title : Opt. Express
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 16 (15) Sequence Number: - Start / End Page: 11007 - 11020 Identifier: ISSN: 1094-4087