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  Towards phasing using high X-ray intensity

Galli, L., Son, S.-K., Barends, T. R. M., White, T. A., Barty, A., Botha, S., et al. (in press). Towards phasing using high X-ray intensity. IUCrJ, 2(6), 627-634. doi:10.1107/S2052252515014049.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-0145-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002E-2A04-9
Genre: Journal Article

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IUCrJ_2_2015_627.pdf (Any fulltext), 410KB
 
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 Creators:
Galli, Lorenzo, Author
Son, Sang-Kil, Author
Barends, Thomas R. M.1, Author              
White, Thomas A., Author
Barty, Anton, Author
Botha, Sabine1, Author              
Boutet, Sébastien, Author
Caleman, Carl, Author
Doak, Bruce1, Author              
Nanao, Max H., Author
Nass, Karol1, Author              
Shoeman, Robert L.1, Author              
Timneanu, Nicusor, Author
Santra, Robin, Author
Schlichting, Ilme1, Author              
Chapmana, Henry N., Author
Affiliations:
1Department of Biomolecular Mechanisms, Max Planck Institute for Medical Research, Max Planck Society, ou_1497700              

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Free keywords: serial femtosecond crystallography; high-intensity phasing; radiation damage; electronic damage; X-ray free-electron lasers; high XFEL doses
 Abstract: Analysis of serial femtosecond crystallography data collected at the Linac Coherent Light Source using two distinct photon fluxes shows different degrees of ionization of Gd atoms bound to a lysozyme protein, due to electronic damage processes. The charge contrast on the heavy atoms is quantified using difference Fourier maps, and the way in which this could be applied to phasing is discussed.

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Language(s): eng - English
 Dates: 2014-11-282015-07-24
 Publication Status: Accepted / In Press
 Pages: 8
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
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Title: IUCrJ
Source Genre: Journal
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Publ. Info: Chester : International Union of Crystallography
Pages: - Volume / Issue: 2 (6) Sequence Number: - Start / End Page: 627 - 634 Identifier: ISSN: 2052-2525