English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Surface Analysis of Zeolites: An XPS, Variable Kinetic Energy XPS, and Low Energy Ion Scattering Study

Bare, S. R., Knop-Gericke, A., Teschner, D., Hävecker, M., Blume, R., Rocha, T., et al. (2016). Surface Analysis of Zeolites: An XPS, Variable Kinetic Energy XPS, and Low Energy Ion Scattering Study. Surface Science, 648, 376-382. doi:10.1016/j.susc.2015.10.048.

Item is

Files

show Files
hide Files
:
Surface Analysis of Zeolites Revised.pdf (Any fulltext), 530KB
Name:
Surface Analysis of Zeolites Revised.pdf
Description:
-
Visibility:
Public
MIME-Type / Checksum:
application/pdf / [MD5]
Technical Metadata:
Copyright Date:
2015
Copyright Info:
Elsevier
License:
-

Locators

show

Creators

show
hide
 Creators:
Bare, Simon R.1, Author
Knop-Gericke, Axel2, Author              
Teschner, Detre2, Author              
Hävecker, Michael2, Author              
Blume, Raoul2, Author              
Rocha, Tulio3, Author
Schlögl, Robert2, Author              
Chan, Ally S.Y.1, Author
Blackwell, N.1, Author
Charochak, M.E.1, Author
Veen, Rik ter4, Author
Brongersma, Hidde5, Author
Affiliations:
1UOP LLC, a Honeywell Company, Des Plaines, IL 60017, USA, ou_persistent22              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
3Laboratório Nacional de Luz Síncrotron, Campinas, Brazil, ou_persistent22              
4Tascon GmbH, Mendelstrasse 17, 48149 Münster, Germany, ou_persistent22              
5Eindhoven University of Technology, P.O. Box 513, 5600MB, Eindhoven, The Netherlands, ou_persistent22              

Content

show
hide
Free keywords: Zeolite; XPS; X-ray photoelectron spectroscopy; Low energy ion scattering spectroscopy; LEIS; Catalysis
 Abstract: The surface Si/Al ratio in a series of zeolite Y samples has been obtained using laboratory XPS, synchrotron (variable kinetic energy) XPS, and low energy ion scattering (LEIS) spectroscopy. The non-destructive depth profile obtained using variable kinetic energy XPS is compared to that from the destructive argon ion bombardment depth profile from the lab XPS instrument. All of the data indicate that the near surface region of both the ammonium form and steamed Y zeolites is strongly enriched in aluminum. It is shown that when the inelastic mean free path of the photoelectrons is taken into account the laboratory XPS of aluminosilicates zeolites does not provide a true measurement of the surface stoichiometry, while variable kinetic energy XPS results in a more surface sensitive measurement. A comprehensive Si/Al concentration profile as a function of depth is developed by combining the data from the three surface characterization techniques. The LEIS spectroscopy reveals that the topmost atomic layer is further enriched in Al compared to subsequent layers.

Details

show
hide
Language(s): eng - English
 Dates: 2015-11-052016-06
 Publication Status: Published in print
 Pages: 7
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/j.susc.2015.10.048
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Surface Science
  Abbreviation : Surf. Sci.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Amsterdam : Elsevier
Pages: 7 Volume / Issue: 648 Sequence Number: - Start / End Page: 376 - 382 Identifier: Other: 0039-6028
CoNE: https://pure.mpg.de/cone/journals/resource/0039-6028