English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Time-resolved single dopant charge dynamics in silicon

Rashidi, M., Burgess, J. A. J., Taucer, M., Achal, R., Pitters, J. L., Loth, S., et al. (2016). Time-resolved single dopant charge dynamics in silicon. Nature Communications, 7: 13258. doi:10.1038/ncomms13258.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-22C7-2 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002B-AE60-D
Genre: Journal Article

Files

show Files
hide Files
:
1512.01101.pdf (Preprint), 2MB
Name:
1512.01101.pdf
Description:
File downloaded from arXiv at 2015-12-04 13:01
Visibility:
Public
MIME-Type / Checksum:
application/pdf / [MD5]
Technical Metadata:
Copyright Date:
2015
Copyright Info:
© M. Rashidi et al.
:
ncomms13258.pdf (Publisher version), 691KB
Name:
ncomms13258.pdf
Description:
-
Visibility:
Public
MIME-Type / Checksum:
application/pdf / [MD5]
Technical Metadata:
Copyright Date:
2016
Copyright Info:
© M. Rashidi et al.
:
ncomms13258-s1.pdf (Supplementary material), 576KB
Name:
ncomms13258-s1.pdf
Description:
-
Visibility:
Public
MIME-Type / Checksum:
application/pdf / [MD5]
Technical Metadata:
Copyright Date:
2016
Copyright Info:
© M. Rashidi et al.

Locators

show
hide
Locator:
http://arxiv.org/abs/1512.01101 (Preprint)
Description:
-
Locator:
http://dx.doi.org/10.1038/ncomms13258 (Publisher version)
Description:
-

Creators

show
hide
 Creators:
Rashidi, Mohammad1, 2, Author
Burgess, Jacob A. J.3, 4, Author              
Taucer, Marco1, 2, Author
Achal, Roshan1, Author
Pitters, Jason L.2, Author
Loth, Sebastian3, 4, Author              
Wolkow, Robert A.1, 2, Author
Affiliations:
1Department of Physics, University of Alberta, Edmonton, Alberta, T6G 2J1, Canada, ou_persistent22              
2National Institute for Nanotechnology, National Research Council of Canada, Edmonton, Alberta, T6G 2M9, Canada, ou_persistent22              
3Dynamics of Nanoelectronic Systems, Independent Research Groups, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938290              
4Max Planck Institute for Solid State Research, ou_persistent22              

Content

show
hide
Free keywords: Condensed Matter; Mesoscale and Nanoscale Physics; Imaging techniques; Semiconductors
 Abstract: As the ultimate miniaturization of semiconductor devices approaches, it is imperative that the effects of single dopants be clarified. Beyond providing insight into functions and limitations of conventional devices, such information enables identification of new device concepts. Investigating single dopants requires sub-nanometre spatial resolution, making scanning tunnelling microscopy an ideal tool. However, dopant dynamics involve processes occurring at nanosecond timescales, posing a significant challenge to experiment. Here we use time-resolved scanning tunnelling microscopy and spectroscopy to probe and study transport through a dangling bond on silicon before the system relaxes or adjusts to accommodate an applied electric field. Atomically resolved, electronic pump-probe scanning tunnelling microscopy permits unprecedented, quantitative measurement of time-resolved single dopant ionization dynamics. Tunnelling through the surface dangling bond makes measurement of a signal that would otherwise be too weak to detect feasible. Distinct ionization and neutralization rates of a single dopant are measured and the physical process controlling those are identified.

Details

show
hide
Language(s): eng - English
 Dates: 2015-12-032016-06-152016-09-082016-10-26
 Publication Status: Published online
 Pages: 7
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: arXiv: 1512.01101
DOI: 10.1038/ncomms13258
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Nature Communications
  Abbreviation : Nat. Commun.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: London : Nature Publishing Group
Pages: - Volume / Issue: 7 Sequence Number: 13258 Start / End Page: - Identifier: ISSN: 2041-1723
CoNE: /journals/resource/2041-1723