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  Universal contact-line dynamics at the nanoscale

Rivetti, M., Salez, T., Benzaquen, M., Raphael, E., & Bäumchen, O. (2015). Universal contact-line dynamics at the nanoscale. Soft Matter, 11(48), 9247-9253. doi:10.1039/C5SM01907A.

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 Urheber:
Rivetti, Marco1, Autor           
Salez, Thomas, Autor
Benzaquen, Michael, Autor
Raphael, Elie, Autor
Bäumchen, Oliver1, Autor           
Affiliations:
1Group Dynamics of fluid and biological interfaces, Department of Dynamics of Complex Fluids, Max Planck Institute for Dynamics and Self-Organization, Max Planck Society, ou_2063300              

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 Zusammenfassung: The relaxation dynamics of the contact angle between a viscous liquid and a smooth substrate is studied at the nanoscale. Through atomic force microscopy measurements of polystyrene nanostripes we simultaneously monitor both the temporal evolution of the liquid–air interface and the position of the contact line. The initial configuration exhibits high curvature gradients and a non-equilibrium contact angle that drive liquid flow. Both these conditions are relaxed to achieve the final state, leading to three successive regimes in time: (i) stationary contact line levelling; (ii) receding contact line dewetting; (iii) collapse of the two fronts. For the first regime, we reveal the existence of a self-similar evolution of the liquid interface, which is in excellent agreement with numerical calculations from a lubrication model. For different liquid viscosities and film thicknesses we provide evidence for a transition to dewetting featuring a universal critical contact angle and dimensionless time.

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Sprache(n): eng - English
 Datum: 2015-10-062015-12-28
 Publikationsstatus: Erschienen
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 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.1039/C5SM01907A
BibTex Citekey: rivetti-sm-2015
 Art des Abschluß: -

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Titel: Soft Matter
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: -
Seiten: - Band / Heft: 11 (48) Artikelnummer: - Start- / Endseite: 9247 - 9253 Identifikator: ISSN: 1744-683X