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  Self-assembled silane monolayers: An efficient step-by-step recipe for high-quality, low energy surfaces

Lessel, M., Bäumchen, O., Klos, M., Hähl, H., Fetzer, R., Paulus, M., et al. (2015). Self-assembled silane monolayers: An efficient step-by-step recipe for high-quality, low energy surfaces. Surface and Interface Analysis, 47(5), 557-564. doi:10.1002/sia.5729.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-6113-D Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002A-C29B-9
Genre: Journal Article

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 Creators:
Lessel, Matthias, Author
Bäumchen, Oliver1, Author              
Klos, Mischa, Author
Hähl, Hendrik, Author
Fetzer, Renate, Author
Paulus, Michael, Author
Seemann, Ralf2, Author              
Jacobs, Karin, Author
Affiliations:
1Group Dynamics of fluid and biological interfaces, Department of Dynamics of Complex Fluids, Max Planck Institute for Dynamics and Self-Organization, Max Planck Society, DE, ou_2063300              
2Group Geometry of Fluid Interfaces, Department of Dynamics of Complex Fluids, Max Planck Institute for Dynamics and Self-Organization, Max Planck Society, DE, ou_2063311              

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 Abstract: Organosilane self-assembled monolayers (SAMs) are commonly used for modifying a wide range of substrates. Depending on the end group, highly hydrophobic or hydrophilic surfaces can be achieved. Silanization bases on the adsorption, self-assembly and covalent binding of silane molecules onto surfaces and results in a densely packed, SAM. Following wet chemical routines, the quality of the monolayer is often variable and, therefore, unsatisfactory. The process of self-assembly is not only affected by the chemicals involved and their purity but is also extremely sensitive to ambient parameters such as humidity or temperature and to contaminants. Here, a reliable and efficient wet-chemical recipe is presented for the preparation of ultra-smooth, highly ordered alkyl-terminated silane SAMs on Si wafers. The resulting surfaces are characterized by means of atomic force microscopy, X-ray reflectometry and contact angle measurements.

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Language(s): eng - English
 Dates: 2015-02-132015-05
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1002/sia.5729
BibTex Citekey: lessel-sia-2015
 Degree: -

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Title: Surface and Interface Analysis
Source Genre: Journal
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Publ. Info: New York, NY : Wiley
Pages: - Volume / Issue: 47 (5) Sequence Number: - Start / End Page: 557 - 564 Identifier: ISSN: 0142-2421
CoNE: /journals/resource/954925471358