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  Towards monomaterial p-n junctions: single-step fabrication of tin oxide films and their non-destructive characterisation by angle-dependent X-ray photoelectron spectroscopy

Krzywiecki, M., Sarfraz, A., & Erbe, A. (2015). Towards monomaterial p-n junctions: single-step fabrication of tin oxide films and their non-destructive characterisation by angle-dependent X-ray photoelectron spectroscopy. Applied Physics Letters, 107(23): 231601. doi:10.1063/1.4937003.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-2749-5 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-CB56-4
Genre: Journal Article

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 Creators:
Krzywiecki, Maciej1, Author              
Sarfraz, Adnan2, Author              
Erbe, Andreas2, Author              
Affiliations:
1Institute of Physics – CSE, Silesian University of Technology, B. Krzywoustego 2, 44–100 Gliwice, Poland, ou_persistent22              
2Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              

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Language(s): eng - English
 Dates: 2015
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1063/1.4937003
 Degree: -

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Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Melville, NY : American Institute of Physics
Pages: 6 Volume / Issue: 107 (23) Sequence Number: 231601 Start / End Page: - Identifier: Other: 0003-6951
CoNE: /journals/resource/954922836223