English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
 Local TagsRelease HistoryDetailsSummary
  Towards monomaterial p-n junctions: single-step fabrication of tin oxide films and their non-destructive characterisation by angle-dependent X-ray photoelectron spectroscopy

Krzywiecki, M., Sarfraz, A., & Erbe, A. (2015). Towards monomaterial p-n junctions: single-step fabrication of tin oxide films and their non-destructive characterisation by angle-dependent X-ray photoelectron spectroscopy. Applied Physics Letters, 107(23): 231601. doi:10.1063/1.4937003.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-2749-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-CB56-4
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Krzywiecki, Maciej1, Author           
Sarfraz, Adnan2, Author           
Erbe, Andreas2, Author           
Affiliations:
1Institute of Physics – CSE, Silesian University of Technology, B. Krzywoustego 2, 44–100 Gliwice, Poland, ou_persistent22              
2Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2015
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1063/1.4937003
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Melville, NY : American Institute of Physics
Pages: 6 Volume / Issue: 107 (23) Sequence Number: 231601 Start / End Page: - Identifier: Other: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223