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  Deep Reflectance Maps

Rematas, K., Ritschel, T., Fritz, M., Gavves, E., & Tuytelaars, T. (2016). Deep Reflectance Maps. In 29th IEEE Conference on Computer Vision and Pattern Recognition (pp. 4508-4516). Los Alamitos, CA: IEEE Computer Society. doi:10.1109/CVPR.2016.488.

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 Urheber:
Rematas, Konstantinos1, Autor           
Ritschel, Tobias1, Autor           
Fritz, Mario2, Autor           
Gavves, Efstratios1, Autor
Tuytelaars, Tinne1, Autor
Affiliations:
1External Organizations, ou_persistent22              
2Computer Vision and Multimodal Computing, MPI for Informatics, Max Planck Society, ou_1116547              

Inhalt

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Schlagwörter: Computer Science, Computer Vision and Pattern Recognition, cs.CV
 Zusammenfassung: Undoing the image formation process and therefore decomposing appearance into its intrinsic properties is a challenging task due to the under-constraint nature of this inverse problem. While significant progress has been made on inferring shape, materials and illumination from images only, progress in an unconstrained setting is still limited. We propose a convolutional neural architecture to estimate reflectance maps of specular materials in natural lighting conditions. We achieve this in an end-to-end learning formulation that directly predicts a reflectance map from the image itself. We show how to improve estimates by facilitating additional supervision in an indirect scheme that first predicts surface orientation and afterwards predicts the reflectance map by a learning-based sparse data interpolation. In order to analyze performance on this difficult task, we propose a new challenge of Specular MAterials on SHapes with complex IllumiNation (SMASHINg) using both synthetic and real images. Furthermore, we show the application of our method to a range of image-based editing tasks on real images.

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Sprache(n): eng - English
 Datum: 2015-11-1320162016-12-122016
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: BibTex Citekey: rematas16cvpr
DOI: 10.1109/CVPR.2016.488
 Art des Abschluß: -

Veranstaltung

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Titel: 29th IEEE Conference on Computer Vision and Pattern Recognition
Veranstaltungsort: Las Vegas, NV, USA
Start-/Enddatum: 2016-06-26 - 2016-07-01

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Titel: 29th IEEE Conference on Computer Vision and Pattern Recognition
  Kurztitel : CVPR 2016
Genre der Quelle: Konferenzband
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: Los Alamitos, CA : IEEE Computer Society
Seiten: - Band / Heft: - Artikelnummer: - Start- / Endseite: 4508 - 4516 Identifikator: ISBN: 978-1-4673-8851-1