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  A joint first principles and Kelvin Probe Force Microscopy study of stepped Silicon Surfaces with Unprecedented Resolution

Pérez León, C., Drees, H., Marz, M., Wippermann, S. M., & Hoffmann-Vogel, R. (2015). A joint first principles and Kelvin Probe Force Microscopy study of stepped Silicon Surfaces with Unprecedented Resolution. Talk presented at APS March Meeting 2015. San Antonio, TX, USA. 2015-03-02 - 2015-03-06.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-7E0B-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0029-7E0C-0
Genre: Talk

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 Creators:
Pérez León, Carmen1, Author              
Drees, Holger1, Author              
Marz, Michael1, Author              
Wippermann, Stefan Martin2, Author              
Hoffmann-Vogel, Regina1, Author              
Affiliations:
1Physikalisches Institut, Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Str. 1, D-76131 Karlsruhe, Germany, ou_persistent22              
2Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863350              

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Language(s): eng - English
 Dates: 2015-03
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: APS March Meeting 2015
Place of Event: San Antonio, TX, USA
Start-/End Date: 2015-03-02 - 2015-03-06

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