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  Measurement of contact line tension by analysis of the three-phase boundary with nanometer resolution

Pompe, T., Fery, A., & Herminghaus, S. (1999). Measurement of contact line tension by analysis of the three-phase boundary with nanometer resolution. Journal of Adhesion Science and Technology, 13(10), 1155-1164. doi:10.1163/156856199X00848.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-A944-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0029-A945-F
Genre: Journal Article

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 Creators:
Pompe, Tilo1, Author
Fery, Andreas, Author
Herminghaus, Stephan2, Author           
Affiliations:
1External Organizations, ou_persistent22              
2Group Granular matter and irreversibility, Department of Dynamics of Complex Fluids, Max Planck Institute for Dynamics and Self-Organization, Max Planck Society, ou_2063306              

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Free keywords: Contact line tension, scanning force microscopy, modified Young equation
 Abstract: Liquid structures on solid substrates have been imaged with a resolution in the nanometer range by scanning force microscopy in the tapping mode. Using Substrates with an artificially patterned wettability, characteristic features in the three-phase contact line were induced, which allow the contact line tension to be determined. The values in the range of -1 x 10-10 N obtained for sessile droplets of hexaethylene glycol arc consistent with theoretical predictions.

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Language(s): eng - English
 Dates: 1999
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1163/156856199X00848
BibTex Citekey: pompe_measurement_1999
 Degree: -

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Title: Journal of Adhesion Science and Technology
Source Genre: Journal
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Publ. Info: Utrecht : VNU Science Press
Pages: - Volume / Issue: 13 (10) Sequence Number: - Start / End Page: 1155 - 1164 Identifier: ISSN: 0169-4243
CoNE: https://pure.mpg.de/cone/journals/resource/954925485731