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  Local transport measurements in graphene on SiO2 using Kelvin probe force microscopy.

Willke, P., Möhle, C., Sinterhauf, A., Kotzott, T., Yu, H. K., Wodtke, A. M., et al. (2016). Local transport measurements in graphene on SiO2 using Kelvin probe force microscopy. Carbon, 102, 470-476. doi:10.1016/j.carbon.2016.02.067.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002A-303B-D Version Permalink: http://hdl.handle.net/21.11116/0000-0000-8339-C
Genre: Journal Article

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 Creators:
Willke, P., Author
Möhle, C., Author
Sinterhauf, A., Author
Kotzott, T., Author
Yu, H. K.1, Author              
Wodtke, A. M.1, Author              
Wenderoth, M., Author
Affiliations:
1Department of Dynamics at Surfaces, MPI for Biophysical Chemistry, Max Planck Society, ou_578600              

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 Abstract: By using Kelvin Probe Force Microscopy with an additional applied electric field we investigate the local voltage drop in graphene on SiO2 under ambient conditions. We are able to quantify the variation of the local sheet resistance and to resolve localized voltage drops at line defects. Our data demonstrates that the resistance of line defects has been overestimated so far. Moreover, we show that wrinkles have the largest resistance, rho(Wrinkle) < 80 Omega mu m. Temperature-dependent measurements show that the local monolayer sheet resistance reflects the macroscopic increase in resistance with temperature while the defect resistance for folded wrinkles is best described by a temperature-independent model which we attribute to interlayer tunneling.

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Language(s): eng - English
 Dates: 2016-02-262016-06
 Publication Status: Published in print
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 Rev. Method: Peer
 Identifiers: DOI: 10.1016/j.carbon.2016.02.067
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Title: Carbon
Source Genre: Journal
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Pages: - Volume / Issue: 102 Sequence Number: - Start / End Page: 470 - 476 Identifier: -