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  Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films

Schwarz, T., Cojocaru-Mirédin, O., Choi, P.-P., Mousel, M., Redinger, A., Siebentritt, S., et al. (2015). Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films. Journal of Applied Physics, 118(9): 095302. doi:10.1063/1.4929874.

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 Creators:
Schwarz, Torsten1, Author           
Cojocaru-Mirédin, Oana1, Author           
Choi, Pyuck-Pa1, Author           
Mousel, Marina2, Author           
Redinger, Alex3, Author           
Siebentritt, Susanne2, Author           
Raabe, Dierk4, Author           
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22              
3Helmholtz-Zentrum Berlin, Department Complex Compound Semiconductor Materials for Photovoltaics, 14109, Berlin, Germany, ou_persistent22              
4Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2015
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1063/1.4929874
 Degree: -

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Title: Journal of Applied Physics
  Abbreviation : J. Appl. Phys.
Source Genre: Journal
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Publ. Info: New York, NY : AIP Publishing
Pages: - Volume / Issue: 118 (9) Sequence Number: 095302 Start / End Page: - Identifier: -