Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films

Schwarz, Torsten; Cojocaru-Mirédin, Oana; Choi, Pyuck-Pa; Mousel, Marina; Redinger, Alex; Siebentritt, Susanne; Raabe, Dierk

doi:10.1063/1.4929874

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Atom probe tomography study of internal interfaces in Cu₂ZnSnSe₄ thin-films

Schwarz, T., Cojocaru-Mirédin, O., Choi, P.-P., Mousel, M., Redinger, A., Siebentritt, S., et al. (2015). Atom probe tomography study of internal interfaces in Cu₂ZnSnSe₄ thin-films. Journal of Applied Physics, 118(9): 095302. doi:10.1063/1.4929874.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-3731-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-3732-3

Genre: Journal Article

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Creators:
Schwarz, Torsten¹, Author
Cojocaru-Mirédin, Oana¹, Author
Choi, Pyuck-Pa¹, Author
Mousel, Marina², Author
Redinger, Alex³, Author
Siebentritt, Susanne², Author
Raabe, Dierk⁴, Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22
3Helmholtz-Zentrum Berlin, Department Complex Compound Semiconductor Materials for Photovoltaics, 14109, Berlin, Germany, ou_persistent22
4Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Date issued: 2015

Publication Status: Issued

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Identifiers: DOI: 10.1063/1.4929874

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Title: Journal of Applied Physics

Abbreviation : J. Appl. Phys.

Source Genre: Journal

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Publ. Info: New York, NY : AIP Publishing

Pages: - Volume / Issue: 118 (9) Sequence Number: 095302 Start / End Page: - Identifier: -