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  Model Order Reduction for Nanoelectronics Coupled Problems with Many Inputs

Banagaaya, N., Feng, L., Schoenmaker, W., Meuris, P., Wieers, A., Gillon, R., et al. (2016). Model Order Reduction for Nanoelectronics Coupled Problems with Many Inputs. In Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) (pp. 313-318).

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002B-AA13-C Version Permalink: http://hdl.handle.net/21.11116/0000-0000-84D3-C
Genre: Conference Paper

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 Creators:
Banagaaya, Nicodemus1, Author              
Feng, Lihong1, Author              
Schoenmaker, Wim2, Author
Meuris, Peter2, Author
Wieers, Aarnout3, Author
Gillon, Renaud3, Author
Benner, Peter1, Author              
Affiliations:
1Computational Methods in Systems and Control Theory, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society, ou_1738141              
2Magwel NV, Martelarenplein 13, B-3000 Leuven, Belgium, ou_persistent22              
3ON Semiconductor Belgium, Oudenaarde, Belgium, ou_persistent22              

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 Dates: 2016
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: ISBN: 978-3-9815-3707-9
 Degree: -

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Title: 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE 2016)
Place of Event: Dresden, Germany
Start-/End Date: 2016-03-14 - 2016-03-18

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Project name : nanoCOPS - Nanoelectronic COupled Problems Solutions
Grant ID : 619166
Funding program : Funding Programme 7 (FP7)
Funding organization : European Commission (EC)

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Title: Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Source Genre: Proceedings
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 313 - 318 Identifier: -