Microsegregation and precipitates of an as-cast Co-based 
superalloy-microstructural characterization and phase stability modelling

Koßmann, Jörg; Zenk, Christopher H.; Lopez-Galilea, Inmaculada; Neumeier, Steffen; Kostka, Aleksander; Huth, Stephan; Theisen, Werner; Göken, Mathias; Drautz, Ralf; Hammerschmidt, Thomas

doi:10.1007/s10853-015-9177-8

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Microsegregation and precipitates of an as-cast Co-based superalloy-microstructural characterization and phase stability modelling

Koßmann, J., Zenk, C. H., Lopez-Galilea, I., Neumeier, S., Kostka, A., Huth, S., et al. (2015). Microsegregation and precipitates of an as-cast Co-based superalloy-microstructural characterization and phase stability modelling. Journal of Materials Science: Materials in Electronics, 50(19), 6329-6338. doi:10.1007/s10853-015-9177-8.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-5E5E-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-5E5F-3

Genre: Journal Article

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Creators:
Koßmann, Jörg¹, Author
Zenk, Christopher H.², Author
Lopez-Galilea, Inmaculada³, Author
Neumeier, Steffen², Author
Kostka, Aleksander⁴, Author
Huth, Stephan³, Author
Theisen, Werner³, Author
Göken, Mathias², Author
Drautz, Ralf⁵, Author
Hammerschmidt, Thomas¹, Author

Affiliations:
1ICAMS, Ruhr-Universität Bochum, Bochum, Germany, ou_persistent22
2Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Materials Science and Engineering, Institute i, Martensstr. 5, 91058 Erlangen, Germany, ou_persistent22
3Lehrstuhl Werkstofftechnik, Ruhr-Universität Bochum, Bochum, Germany, ou_persistent22
4High-Temperature Materials, External Max Planck Fellow, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863347
5ICAMS, Materials Research Department, Ruhr-Universität Bochum, Universitätsstraße 90a, Bochum, Germany, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 2015-10-25

Publication Status: Issued

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Identifiers: ISI: 000358149600009
DOI: 10.1007/s10853-015-9177-8

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Title: Journal of Materials Science: Materials in Electronics

Other : J. Mater. Sci. - Mater. El.

Source Genre: Journal

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Publ. Info: London : Chapman and Hall

Pages: - Volume / Issue: 50 (19) Sequence Number: - Start / End Page: 6329 - 6338 Identifier: ISSN: 0957-4522
CoNE: https://pure.mpg.de/cone/journals/resource/954925577043