Recognizing 60 years of achievements in field emission and atomic scale 
microscopy: Reflections on the International Field Emission Society

Cairney, Julie M.; Gault, Baptiste; Larson, David J.

doi:10.1016/j.mattod.2016.01.019

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Recognizing 60 years of achievements in field emission and atomic scale microscopy: Reflections on the International Field Emission Society

Cairney, J. M., Gault, B., & Larson, D. J. (2016). Recognizing 60 years of achievements in field emission and atomic scale microscopy: Reflections on the International Field Emission Society. Materials Today, 19(4), 182-183. doi:10.1016/j.mattod.2016.01.019.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-CB1E-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-CB1F-C

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Creators:
Cairney, Julie M.¹, Author
Gault, Baptiste², Author
Larson, David J.³, Author

Affiliations:
1Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia, ou_persistent22
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
3CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI, USA, ou_persistent22

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Language(s): eng - English

Dates: Published Online: 2016-02-19Date issued: 2016-05

Publication Status: Issued

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Identifiers: DOI: 10.1016/j.mattod.2016.01.019

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Title: Materials Today

Source Genre: Journal

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Pages: - Volume / Issue: 19 (4) Sequence Number: - Start / End Page: 182 - 183 Identifier: ISSN: 1369-7021
CoNE: https://pure.mpg.de/cone/journals/resource/1369-7021