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  Recognizing 60 years of achievements in field emission and atomic scale microscopy: Reflections on the International Field Emission Society

Cairney, J. M., Gault, B., & Larson, D. J. (2016). Recognizing 60 years of achievements in field emission and atomic scale microscopy: Reflections on the International Field Emission Society. Materials Today, 19(4), 182-183. doi:10.1016/j.mattod.2016.01.019.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002A-CB1E-E Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002A-CB1F-C
Genre: Journal Article

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 Creators:
Cairney, Julie M.1, Author              
Gault, Baptiste2, Author              
Larson, David J.3, Author              
Affiliations:
1Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia, ou_persistent22              
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
3CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI, USA, ou_persistent22              

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Language(s): eng - English
 Dates: 2016-02-192016-05
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1016/j.mattod.2016.01.019
 Degree: -

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Title: Materials Today
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 19 (4) Sequence Number: - Start / End Page: 182 - 183 Identifier: ISSN: 1369-7021
CoNE: /journals/resource/1369-7021