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  Stimulated Electronic X-Ray Raman Scattering

Weninger, C., Purvis, M., Ryan, D., London, R. A., Bozek, J. D., Bostedt, C., et al. (2013). Stimulated Electronic X-Ray Raman Scattering. Physical Review Letters, 111(23): 233902. doi:10.1103/PhysRevLett.111.233902.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002A-E284-1 Version Permalink: http://hdl.handle.net/21.11116/0000-0003-58A8-D
Genre: Journal Article

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 Creators:
Weninger, Clemens1, 2, 3, Author              
Purvis, M.4, Author
Ryan, D.4, Author
London, R. A.5, Author
Bozek, J. D.6, Author
Bostedt, C.6, Author
Graf, A.5, Author
Brown, G.5, Author
Rocca, J. J.4, Author
Rohringer, Nina1, 2, 3, Author              
Affiliations:
1Max Planck Institute for the Physics of Complex Systems, Max Planck Society, ou_2117288              
2Center for Free-Electron Laser Science, 22761 Hamburg, Germany, ou_persistent22              
3International Max Planck Research School for Ultrafast Imaging & Structural Dynamics (IMPRS-UFAST), Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_2266714              
4Colorado Sate University, Fort Collins, Colorado 80523, USA, ou_persistent22              
5Lawrence Livermore National Laboratory, Livermore, California 94551, USA, ou_persistent22              
6LCLS, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA, ou_persistent22              

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Free keywords: PACS numbers: 42.55.Vc, 32.30.Rj, 42.65.Dr, 78.70.Ck
 Abstract: We demonstrate strong stimulated inelastic x-ray scattering by resonantly exciting a dense gas target of neon with femtosecond, high-intensity x-ray pulses from an x-ray free-electron laser (XFEL). A small number of lower energy XFEL seed photons drive an avalanche of stimulated resonant inelastic x-ray scattering processes that amplify the Raman scattering signal by several orders of magnitude until it reaches saturation. Despite the large overall spectral width, the internal spiky structure of the XFEL spectrum determines the energy resolution of the scattering process in a statistical sense. This is demonstrated by observing a stochastic line shift of the inelastically scattered x-ray radiation. In conjunction with statistical methods, XFELs can be used for stimulated resonant inelastic x-ray scattering, with spectral resolution smaller than the natural width of the core-excited, intermediate state.

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Language(s): eng - English
 Dates: 2013-06-162013-12-052013-12-06
 Publication Status: Published in print
 Pages: 5
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 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1103/PhysRevLett.111.233902
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Title: Physical Review Letters
Source Genre: Journal
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Pages: - Volume / Issue: 111 (23) Sequence Number: 233902 Start / End Page: - Identifier: ISSN: 0031-9007