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  Atom probe tomography of interfaces in ceramic films and oxide scales

Stiller, K. M., Thuvander, M., Povstugar, I., Choi, P.-P., & Andrén, H. O. (2016). Atom probe tomography of interfaces in ceramic films and oxide scales. MRS Bulletin, 41(1), 35-39. doi:10.1557/mrs.2015.307.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002A-E3F3-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002A-E3F4-0
Genre: Journal Article

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 Creators:
Stiller, Krystyna Marta1, Author              
Thuvander, Mattias2, Author              
Povstugar, Ivan3, Author              
Choi, Pyuck-Pa3, Author              
Andrén, Hans Olof1, Author              
Affiliations:
1Department of Applied Physics, Division of Materials Microstructure, Chalmers University of Technology, Sweden, ou_persistent22              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              

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Language(s): eng - English
 Dates: 2016-01-08
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1557/mrs.2015.307
 Degree: -

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Title: MRS Bulletin
  Abbreviation : MRS Bull.
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 41 (1) Sequence Number: - Start / End Page: 35 - 39 Identifier: ISSN: 0883-7694
CoNE: /journals/resource/954925549328