A perspective on the ion projection in field ion & atom probe microscopy

Gault, Baptiste; De Geuser, Frédéric

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A perspective on the ion projection in field ion & atom probe microscopy

Gault, B., & De Geuser, F. (2016). A perspective on the ion projection in field ion & atom probe microscopy. Talk presented at Atom Probe Tomography & Microscopy 2016. Gyeongju, South Korea. 2016-06-12 - 2016-06-17.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-101A-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-C556-7

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Creators:
Gault, Baptiste¹, Author
De Geuser, Frédéric^{2, 3}, Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2CNRS, SIMAP, F-38000 Grenoble, France, persistent22
3Université Grenoble Alpes, SIMAP, F-38000 Grenoble, France, persistent22

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Language(s): eng - English

Dates: Created: 2016-06

Publication Status: Not specified

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Title: Atom Probe Tomography & Microscopy 2016

Place of Event: Gyeongju, South Korea

Start-/End Date: 2016-06-12 - 2016-06-17

Invited: Yes

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