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  A perspective on the ion projection in field ion & atom probe microscopy

Gault, B., & De Geuser, F. (2016). A perspective on the ion projection in field ion & atom probe microscopy. Talk presented at Atom Probe Tomography & Microscopy 2016. Gyeongju, South Korea. 2016-06-12 - 2016-06-17.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002B-101A-8 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-C556-7
Genre: Talk

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 Creators:
Gault, Baptiste1, Author              
De Geuser, Frédéric2, 3, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2CNRS, SIMAP, F-38000 Grenoble, France, persistent22              
3Université Grenoble Alpes, SIMAP, F-38000 Grenoble, France, persistent22              

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Language(s): eng - English
 Dates: 2016-06
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: Atom Probe Tomography & Microscopy 2016
Place of Event: Gyeongju, South Korea
Start-/End Date: 2016-06-12 - 2016-06-17
Invited: Yes

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