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  Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells

Zaefferer, S., & Stechmann, G. (2015). Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. In K. Wetzig (Ed.), Tagungsband des EFDS Workshops “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung”.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002B-107D-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002B-107F-6
Genre: Conference Paper

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 Creators:
Zaefferer, Stefan1, Author              
Stechmann, Guillaume2, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
 Dates: 2015
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: EFDS Workshop “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung”
Place of Event: Dresden, Germany
Start-/End Date: 2015-03-12

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Title: Tagungsband des EFDS Workshops “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung”
Source Genre: Proceedings
 Creator(s):
Wetzig, Klaus1, Editor            
Affiliations:
1 Leibniz-Institut für Festkörper- und Werkstoffforschung, PF 27 01 16, Dresden D-01171, Germany, ou_persistent22            
Publ. Info: -
Pages: 156 Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: -