Electron backscatter diffraction (EBSD) and electron channelling contrast 
imaging (ECCI) for the study of thin film solar cells

Zaefferer, Stefan; Stechmann, Guillaume

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Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells

Zaefferer, S., & Stechmann, G. (2015). Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. In K. Wetzig (Ed.), Tagungsband des EFDS Workshops “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung”.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-107D-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-107F-6

Genre: Conference Paper

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Creators:
Zaefferer, Stefan¹, Author
Stechmann, Guillaume², Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Date issued: 2015

Publication Status: Issued

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Title: EFDS Workshop “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung”

Place of Event: Dresden, Germany

Start-/End Date: 2015-03-12

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Title: Tagungsband des EFDS Workshops “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung”

Source Genre: Proceedings

Creator(s):
Wetzig, Klaus¹, Editor

Affiliations:
1 Leibniz-Institut für Festkörper- und Werkstoffforschung, PF 27 01 16, Dresden D-01171, Germany, ou_persistent22

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Pages: 156 Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: -