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  Bandgap Modulation in Photoexcited Topological Insulator Bi2Te3 via Atomic Displacements

Hada, M., Norimatsu, K., Tanaka, S., Keskin, S., Tsuruta, T., Igarashi, K., et al. (2016). Bandgap Modulation in Photoexcited Topological Insulator Bi2Te3 via Atomic Displacements. The Journal of Chemical Physics, 145(2): 024504. doi:10.1063/1.4955188.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002B-09B3-0 Version Permalink: http://hdl.handle.net/21.11116/0000-0004-93A4-C
Genre: Journal Article

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http://dx.doi.org/10.1063/1.4955188 (Publisher version)
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 Creators:
Hada, Masaki1, 2, 3, Author
Norimatsu, Katsura2, Author
Tanaka, Sei′ichi4, Author
Keskin, Sercan5, 6, 7, Author              
Tsuruta, Tetsuya2, Author
Igarashi, Kyushiro2, Author
Ishikawa, Tadahiko4, Author
Kayanuma, Yosuke2, Author
Miller, R. J. Dwayne5, 6, 8, Author              
Onda, Ken3, 9, Author
Sasagawa, Takao2, Author
Koshihara, Shin-ya4, Author
Nakamura, Kazutaka G.2, Author
Affiliations:
1Graduate School of Natural Science and Technology, Okayama University, Okayama 700-8530, Japan, ou_persistent22              
2Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan, ou_persistent22              
3PRESTO, Japan Science and Technology Agency, Kawaguchi 332-0012, Japan, ou_persistent22              
4Department of Chemistry and Materials Science, Tokyo Institute of Technology, Tokyo 152-8551, Japan, ou_persistent22              
5Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938288              
6The Hamburg Centre for Ultrafast Imaging, University of Hamburg, 22761 Hamburg, Germany, ou_persistent22              
7International Max Planck Research School for Ultrafast Imaging & Structural Dynamics (IMPRS-UFAST), Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_2266714              
8Departments of Chemistry and Physics, University of Toronto, Toronto M5S 3H6, Canada, ou_persistent22              
9Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan, ou_persistent22              

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Free keywords: Band gap; Reflectivity; Electron diffraction; Photoexcitations; Time resolved spectroscopy
 Abstract: The atomic and electronic dynamics in the topological insulator (TI) Bi2Te3 under strong photoexcitation were characterized with time-resolved electron diffraction and time-resolved mid-infrared spectroscopy. Three-dimensional TIs characterized as bulk insulators with an electronic conduction surface band have shown a variety of exotic responses in terms of electronic transport when observed under conditions of applied pressure, magnetic field, or circularly polarized light. However, the atomic motions and their correlation between electronic systems in TIs under strong photoexcitation have not been explored. The artificial and transient modification of the electronic structures in TIs via photoinduced atomic motions represents a novel mechanism for providing a comparable level of bandgap control. The results of time-domain crystallography indicate that photoexcitation induces two-step atomic motions: first bismuth and then tellurium center-symmetric displacements. These atomic motions in Bi2Te3 trigger 10% bulk bandgap narrowing, which is consistent with the time-resolved mid-infrared spectroscopy results.

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Language(s): eng - English
 Dates: 2016-03-082016-06-142016-07-132016-07-14
 Publication Status: Published in print
 Pages: 9
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1063/1.4955188
 Degree: -

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Title: The Journal of Chemical Physics
  Other : J. Chem. Phys.
Source Genre: Journal
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Publ. Info: Woodbury, N.Y. : American Institute of Physics
Pages: - Volume / Issue: 145 (2) Sequence Number: 024504 Start / End Page: - Identifier: ISSN: 0021-9606
CoNE: /journals/resource/954922836226