Chromium and silicon poisoning of the IT-SOFC cathode material La0.6Sr0.4CoO3-δ 
at 800°C

Bucher, E.; Gspan, C.; Höschen, T.; Berger, C.; Hofer, F.; Sitte, W.

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Chromium and silicon poisoning of the IT-SOFC cathode material La_0.6Sr_0.4CoO_3-δ at 800°C

Bucher, E., Gspan, C., Höschen, T., Berger, C., Hofer, F., & Sitte, W. (2016). Chromium and silicon poisoning of the IT-SOFC cathode material La_0.6Sr_0.4CoO_3-δ at 800°C. Talk presented at 2016 E-MRS Spring Meeting. Lille. 2016-05-02 - 2016-05-06.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-25E6-D Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-002C-0E3F-5

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Urheber:
Bucher, E.¹, Autor
Gspan, C.¹, Autor
Höschen, T.², Autor
Berger, C.¹, Autor
Hofer, F.¹, Autor
Sitte, W.¹, Autor

Affiliations:
1External Organizations, ou_persistent22
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327