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  Analysis of power deposition and temperature rise due to presence of an implant inside a 1.5 t MRI RF coil

Kozlov, M., & Schaefers, G. (2015). Analysis of power deposition and temperature rise due to presence of an implant inside a 1.5 t MRI RF coil. In 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) (pp. 5797-5800). Piscataway: IEEE. doi:10.1109/EMBC.2015.7319709.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-41EE-6 Version Permalink: https://hdl.handle.net/21.11116/0000-000D-6161-8
Genre: Conference Paper

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 Creators:
Kozlov, Mikhail1, 2, Author                 
Schaefers, G.1, Author
Affiliations:
1MR:comp GmbH, Gelsenkirchen, Germany, ou_persistent22              
2Department Neurophysics (Weiskopf), MPI for Human Cognitive and Brain Sciences, Max Planck Society, ou_2205649              

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Free keywords: Phantoms; Magnetic resonance imaging; Implants; Glass; Conductivity; Optical fiber sensors; Heating
 Abstract: We numerically investigated power deposition and temperature rise generated due to the presence of a titanium rod placed in a phantom, located inside a 1.5 T coil. The induced power deposition and temperature rise normalized to incident tangential electric field was found to be dependent on distance to the phantom wall. The different dependence of the integral of power deposition over a box surrounded the rod and the temperature rise on American Society for Testing and Materials (ASTM) phantom medium electrical conductivity was observed. The consequences of numerical domain simplification have been analyzed.

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Language(s): eng - English
 Dates: 2015-11-052015
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1109/EMBC.2015.7319709
 Degree: -

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Title: 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)
Source Genre: Proceedings
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Publ. Info: Piscataway : IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 5797 - 5800 Identifier: ISBN: 978-1-4244-9270-1