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  Beam induced atomic migration at Ag containing nanofacets at an asymmetric Cu grain boundary

Peter, N. J., Kirchlechner, C., Liebscher, C., & Dehm, G. (2016). Beam induced atomic migration at Ag containing nanofacets at an asymmetric Cu grain boundary. Poster presented at European Microscopy Congress (EMC) 2016, Lyon, France.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002B-772B-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002B-772C-9
Genre: Poster

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 Creators:
Peter, Nicolas J.1, Author              
Kirchlechner, Christoph2, Author              
Liebscher, Christian1, Author              
Dehm, Gerhard3, Author              
Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
2Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              
3Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398              

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Language(s): eng - English
 Dates: 2016
 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: European Microscopy Congress (EMC) 2016
Place of Event: Lyon, France
Start-/End Date: 2016-08-28 - 2016-09-02

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