Beam induced atomic migration at Ag containing nanofacets at an asymmetric Cu 
grain boundary

Peter, Nicolas J.; Kirchlechner, Christoph; Liebscher, Christian; Dehm, Gerhard

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Beam induced atomic migration at Ag containing nanofacets at an asymmetric Cu grain boundary

Peter, N. J., Kirchlechner, C., Liebscher, C., & Dehm, G. (2016). Beam induced atomic migration at Ag containing nanofacets at an asymmetric Cu grain boundary. Poster presented at European Microscopy Congress (EMC) 2016, Lyon, France.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-772B-B Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-772C-9

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Urheber:
Peter, Nicolas J.¹, Autor
Kirchlechner, Christoph², Autor
Liebscher, Christian¹, Autor
Dehm, Gerhard³, Autor

Affiliations:
1Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399
2Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401
3Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398