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  Stress pattern recognition in cochlear implanted children

Vavatzanidis, N., Mürbe, D., & Hahne, A. (2015). Stress pattern recognition in cochlear implanted children. Talk presented at 18. Jahrestagung der Deutschen Gesellschaft für Audiologie. Bochum, Germany. 2015-03-04 - 2015-03-07.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002B-796D-9 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002B-D3DD-5
Genre: Talk

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 Creators:
Vavatzanidis, Niki1, 2, Author              
Mürbe, Dirk2, Author
Hahne, Anja2, Author              
Affiliations:
1Department Neuropsychology, MPI for Human Cognitive and Brain Sciences, Max Planck Society, ou_634551              
2Saxonian Cochlear Implant Center, Department of Otorhinolaryngology, Technische Universität Dresden, ou_persistent22              

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Free keywords: Cochlear implants; Deafness; Children; Mismatch negativity; Stress pattern; EEG; Language acquisition
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 Dates: 2015-03-07
 Publication Status: Not specified
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Title: 18. Jahrestagung der Deutschen Gesellschaft für Audiologie
Place of Event: Bochum, Germany
Start-/End Date: 2015-03-04 - 2015-03-07

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